Probabilistic Design Presentation 
to the ANSYS User's Group of Western PA 
on July 17,2001 
by Stefan Reh, ANSYS Inc.

The idea of probabilistic design is that there is a fundamental difference between a analyzing a single deterministic analysis scenario on one hand and simulating the entire range of things that can happen in real life on the other hand.
Before I go into the details let me give you an illustration of this difference I am talking about.
I guess most of you have a cell phone. I bet all of you who have dropped you your cell phone you all dropped it at a height of 1.3yards and oriented by an inclination angle of 20 degrees and then turned left by 30 degrees, didn’t you??
What I just described is a single deterministic analysis scenario and that is what I have analyzed in this animation.
In reality of course you very probably have not dropped your cell phone like that, because in reality you could drop a cell phone at any arbitrary orientation and at any reasonable height. Any of these possible dropping scenarios has its own probability of occurrence. Probability of occurrence means for example that it is very likely that would drop your cell phone from a height of 1 to 2 yards.
That you actually throw away your cell phone leading to a very large dropping height - that is of course very unlikely. Although, if you have just received the recent phone bill from your wireless phone company then some people might actually think of throwing the cell phone away, but this is of course a completely different story.
The fact that in real life some scenarios are more likely to occur then others and the fact there are things that can happen and very likely can happen can happen that are never covered in a single deterministic analysis run - this brings me to the probabilistic design system.
If you analyze a product, then the product and how it is operated is described by certain input parameters such as material, geometry and boundary conditions. As a result of the analysis we get certain results like stresses, strains and so on.
 In real life all of these input parameters are subjected to scatter - all of them are uncertain. If you measure material properties you will directly see the scatter. Also the geometrical extensions of a component can only be reproduced within certain tolerances. In many cases the boundary conditions are highly uncertain - think of the orientation of the cell phone.
( As a direct and unavoidable consequence of scatter on the input side is the fact that the results are uncertain as well.
 
In a situation like that probabilistic methods can be used to answer the following questions:
If we have scatter on the input side how wide is the scatter on the output side? Is it negligible?? Is it large??
 If we do have scatter on the output side by chance some the possible scenarios might no longer fulfil certain design criteria that are defined in terms of output parameters. This is then referred to as a failure probability.
 If we do have such a failure probability then of course we want to do something about it and reduce it. In this case we ask what are the most important and sensitive drivers on the input side are so we can tackle them.
 
Another example where uncertainties can be important, but are usually ignored is the calculation of thermal stresses. The thermal stress is proportional to the Young’s modulus, the thermal expansion coefficient and temperature difference.
In the deterministic approach the scatter of the two material parameter is typically ignored and only the mean values E,mean and Alpha,mean are used to calculate the expected thermal stress.
In a probabilistic approach we can first take into account that young’s modulus is subjected to scatter, for example with a standard deviation of ±5%. As a result of the probabilistic analysis we will find that in about 1 out of 6 cases the thermal stresses are at least 5% higher than the deterministically calculated “expected” thermal stress. Still in 1 out of 40 cases the thermal stresses are even more than 10% higher than the “expected” thermal stress.
The situation get even worse if we also include the scatter of the thermal expansion coefficient. If both material are subjected to scatter (which is what they are!) then we have even 1 out of 5 cases where the thermal stress exceeds the deterministic result by 5% and 1 out of 12 cases where the thermal stresses are in excess of 10% higher than the deterministic result.
It should be noted, thermal stress that are 5% or 10% higher than expected don’t seem an awful lot, but if we use these stress results in a low cycle fatigue lifetime calculation then these differences can easily amount to a factor of in the resulting lifetime.
 
In the general case we analyze components and products according to a much more complex process. For example, the geometry is taken from a CAD model, which is then used in a fluid dynamic analysis (CFD) and also a thermal as well as a structural analysis is performed. Eventually we are also interested in calculating the lifetime based on the temperature and stress results.
What you see here is a rough guess of what the uncertainties are associated with the individual input variables of the calculation tools and steps. The higher number are rather applicable for the MEMS area (micro-electromechanical systems) and the lower number are applicable rather for all other cases. Please note that the uncertainties apply to multiple input variables in the relevant databases.
As a result of of these uncertainties on the input side we can really ask ourselves what the accuracy and the scatter of the overall lifetime result will be. To address this question this is what probabilistic design is all about.
 
This slide shows a comparison between the deterministic and probabilistic approaches:
 Deterministic analyses can only provide a binary information derived from the single point solution (the analyzed component is OK or not). Probabilistic methods provide also a probability for the solutions, e.g. a “design for reliability” is possible.
 In deterministic analyses uncertainties are taken into account by safety margins that are stacked up blindly. I.e. we are designing for a component with the weakest geometry and worst material  properties subjected to highest  load. Such a component is literally not existing. This leads to an expensive over-design. In PDS the uncertainties are taken into account in the way they appear in nature.  This way an over-design is avoided, which can safe a lot of money.
 
This slide shows a comparison between the deterministic and probabilistic approaches:
 Deterministic Methods only assess one specific design, whereas PDS  takes the deviations from that design into account that could lead to a tolerance stack-up. Taking this into account enables a smarter design-for-manufacturability, which also can safe a lot of money.
 Deterministic models  have no concept of the deviations that are possible apart from the “as planned” design. In PDS this is inherently taken into account.
 Also in the deterministic approach sensitivities can be evaluated. But this is done by applying a plus and minus Delta-value to an input parameter while keeping all others constant. This way interactions cannot be covered. Interactions lead to the fact that a variation of two parameters at the same time can have a much larger effect then the combined effect of the variation of the two individual  parameters if varied one at a time. According to experience these interaction are important for about 20% of all applications. This is inherently taken into account in probabilistic sensitivities.
 
I don’t want go into very deeply into the details of probabilistic methods.
I just want to mention that we have implemented two methods, namely Monte Carlo Simulations and Response Surface Methods, which are most commonly used and widely accepted. Each of these two methods have their own different sampling techniques or sub-types if you will.
 
What makes these two types of methods even more interesting is that they are most suited for parallel, distributed processing. If one of these methods require say a 100 analysis runs and you have enough computers available, then you can run all these 100 runs in parallel, because they are completely independent.
 
Speaking of parallel distributed processing I think you all know how it works so I can go quickly over this slide.
Each job is sent from a client to a different server machine. The job is execute and the results parameters are shipped back to the client.
It is quite a challenge to implement a fully heterogeneous and cross-platform solution. But when ANSYS 5.7 will be delivered by the end of the year  then will have the probabilistic design system in it and it will be based on a fully heterogeneous parallel distribution solution
 
As you know ANSYS is widely used in the industry and here you see only a few of our customers who gave us permission to show their company logo.
Our probabilistic design system is already being tested by 35 companies worldwide  and some of them are illustrated with the green circles. The ANSYS Probabilistic Design System will be an integral part of ANSYS 5.7.
 
This application example is a Micro-Eletromechanical device.
This is the package and inside is the chip and on the chip is the device.
To give you an impression about the size - this is an American "one cent" coin with a diameter of 19mm. The device has a size of about 0.2mm.
 
The device is widely used a shock sensor, for example to deploy the airbag in case of a crash. But I want to show the use of the device as an electromechanical filter.
As you see here the device is electro-statically charged at the static comb and then due to electro-static forces the moving comb gets pulled into the static comb. The moving comb is supported by a structure that acts as a bending spring and the spring is fixed at two points with pins in the center. Obviously, the underlying problem involves a multi-physics approach, because the solution is ultimately an equilibrium of the electromagnetic forces and the elastic spring back forces of the structure.
The manufacturing process of the device kind of a photo process where the geometry of the device is “burned” into the silicon chip. Since, the device is so tiny the inaccuracy of this process results in a large amount of scatter in the geometrical extensions of the members of the device. In this case I have used 14 random input variables to describe the manufacturing scatter of geometry parameters such as lengths and widths of the fingers and the spring beams of the device. Also the scatter of two material properties was taken into account.
As the relevant output parameter I am looking at the deflection of how far the moving comb gets pulled into the static part.
 
For the entire sensor model I performed a probabilistic analysis with all 14 random geometry and the 2 random material parameters. Here, the results of 400 Monte Carlo Simulations and the Response Surface Method involving 49 Finite-element runs and 10’000 simulation runs using the derived response surface are used. Without going into details I just want to mention that the 10'000 simulations on the response surface took about 1 second to run, so it is the Finite-Element runs that are "expensive" in terms of computations time, and here you compare the 400 runs for Monte Carlo with the 49 for Response Surface Methods.
From the histogram shown on the right side we can see two important findings:
First there is very good agreement between the Monte Carlo results and the response surface results.
Secondly, the scatter range for the maximum deflection of the moving comb has a factor of about 3 between the lowest and the largest value. Again this shows that the uncertainties involved on the material and geometry side have a huge influence on the result parameter.
 
Shown in this slide is the cumulative distribution curve of the maximum deflection.
Again the results of the Response surface method show very good agreement with that of the Monte Carlo simulation method.
You can use a curve like that to design a product to achieve a certain required reliability. For example, if the deflection of the moving comb must be between 0.0065 and 0.0105. The curve says that there is s probability of about 17% to drop below the 0.0065 limit and a 7% (that is 100% minus 93%) probability of exceeding the 0.0105 limit. Together, this makes up for a 24% of probability of falling out side the required interval. In other word in this example the device would have a reliability of 76%. If this is not satisfactory then the sensitivities shown in the following slide can be used to improve the design.
Generally speaking, if you design a component for reliability then the quality control costs and the warranty costs can be minimized.
Again, probabilistic methods can help to make more qualified decisions about the efficient use of valuable resources money.
 
Again, also for the sensitivities there is very good agreement between the results of the two methods. The response surface method has a slight advantage here, because the sensitivities here are based on 10’000 data points, so it has better resolution to look into the details of smaller sensitivities, where Monte Carlo with only 400 data points can no longer safely detect the significance of these smaller sensitivities.
You can use the findings to more efficiently guide the design process towards improving of the product or to guide the quality control process toward looking into the right and important parameters.
In addition, you can also use this information to justify the spending of money at the right place where it is most efficiently spent. For example the material database is very often based on a rather small number of samples (specimen). Then it certainly makes sense to spend money for more measurements to get a more accurate understanding of the scatter of the Young’s modulus. To spend more money to more accurately measure the Poisson’s ratio would be a waste, because the Poisson’s ratio turned out to be insignificant.
Again, probabilistic methods can help to make more qualified decisions about the efficient use of valuable resources such as time and money.
 
As an example for the application of probabilistic methods the analysis of a turbine blade is shown here. The example is a cooled (hollow) rotating blade. The probabilistic analysis includes the randomness of a total of 17 input parameters. For example, the blades are manufactured by precision casting. During casting of the blade a slight shift of the core that makes up the hollow cavity can occur. This core shift makes the wall of blade thinner on one side and thicker on the respective other. Also there is an oxidation protection coating on the hotgas surface of the blade. The thickness of the coating is not an exact value after it is applied, but variations from the targeted thickness may appear.
It is not necessary to explain all random input parameters as listed here. Suffice it to say that the random input parameters are from all categories, namely geometry, material and loads. Also it should be emphasized that various different statistical distribution function can be applied to describe and quantify the randomness of the input parameter, such as the Gaussian distribution, the uniform distribution or the lognormal distribution (the ANSYS/PDS has many more)
The Finite-Element model has about 60’000 elements and 180’000 nodes. One single analysis run includes a thermal analysis to evaluate the temperature field (shown here) and a structural analysis to evaluate the thermo-mechanical stresses. Based on these result also the low cycle fatigue lifetime (LCF), the creep lifetime and the time until the oxidation protection layer has been eroded through is calculated. One such complete analysis takes about 2.5 hours.
 
Crucial in today’s business environment is the development of reliable products. Only reliable products keep the occurrence of premature failures (a failure that happens before the end of the warranty period) at an acceptable level or avoid such failures completely.
The most important measure for a reliable product is a low failure probability. As a result of the probabilistic analysis in this diagram the probability of a failure due to one of the three failure modes (LCF, creep, oxidation) is plotted versus the operation time in years. A particular failure probability can be derived from this plot by choosing a value on the X-axis for the operation time (i.e. the time how long the blade is supposed to be in service) and then going up to the probability curves related to the failure modes and reading the probability on the Y-Axis.
In this diagram the results calculated with the “response surface method” is compared with the results gained from 500 Monte Carlo simulations. in this example, the Monte Carlo Simulation results represent kind of a “true” benchmark values which the “response surface method” result must comply with for the failure probability ranging from 2% to 98%. Obviously, there is a very good agreement between the results of the two methods in this probability range.
Designing a product for a low failure probability ultimately leads to “built-in-quality”, which leads to reduced costs for the manufacturer and an increase in customer satisfaction.
 
Probabilistic methods also automatically and inherently deliver probabilistic sensitivities. Probabilistic sensitivities describe how much the scatter (or the failure probability) of a particular random output parameter (shown here is the LCF lifetime) is affected by the scatter of the individual random input parameters. The probabilistic design system in ANSYS sorts the input parameters into two groups - the significant and the insignificant ones. Then the significant input parameters are ranked by the importance and plotted.
These probabilistic sensitivities proved highly values information in three ways.
1.) If the resulting failure probability is not acceptable, i.e. too high (for example as derived for the previous diagram) then we clearly need to improve the design in order to achieve an acceptable level. The sensitivities clearly indicate which input parameters are the drivers of the high failure probability and therefore must be tackled in order to reduce it. Hence, the input parameters must be tackled in the order of their importance. There is no point in focusing on unimportant parameters.
2.) Sometimes the scatter of some input parameters are just estimated based on no or very little measurement data. If these parameters turn out to be very important for the reliability of the design then this clearly indicates that for example lab test must be done to collect more data about that input parameter.
3.) If the current design is sufficient, i.e. has an acceptably low failure probability, then there is typically the need to save money without sacrificing the achieve reliability. In this case the manufacturing requirements for the input parameters can be relaxed an a possibly coarser and cheaper manufacturing process can be chosen. Or the quality assurance requirements for those parameters can be relaxed. This typically leads to huge saving for manufacturing process related to geometry parameters.
 
With this I would like to summarize my presentation.
I hope I managed to illustrate that probabilistic methods are a very powerful tools to take the randomness and the uncertainties into account as they occur everywhere in real life.
In industrial applications Monte Carlo Methods and Response Surface Methods are mostly used and established and they are even getting much more accepted due to the advances in computer technology and parallel distributed computing, for which both of these methods are perfectly suited.
I illustrated that using probabilistic methods you can design for more reliable products, a higher quality of your products and more robust products. And all of that by saving a lot of money at the same time.
I want to conclude the presentation with a quote from the founder of our company Dr. John Swanson: "A couple of years ago the engineering community had to learn the world is not linear but is better described using non-linear methods. We are now about to learn that the world is not deterministic and is more realistically described by probabilistic methods."
And with this statement I want to finish my presentation and I thank you for your attention.